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funzero said:It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
.
funzero said:It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
When your chip was in silicon format , it can only response to your stimulate .
So you will do your best to achieve this two points.
all your internal node can be set and obeserved,in this point your chip can be full tested .
so DFT means you must think test before your chip 's manufactured .
ray123 said:funzero said:It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
When your chip was in silicon format , it can only response to your stimulate .
So you will do your best to achieve this two points.
all your internal node can be set and obeserved,in this point your chip can be full tested .
so DFT means you must think test before your chip 's manufactured .
What you say is testmode implementation, not DFT.
truebs said:what is design for test in simple terms ?
mvkarthik said:Hi,
This is just a technique to test your chip is manufactured correctly / not. This involves putting in test structures and verifying the same through patterns.
- Karthik
truebs said:what is design for test in simple terms ?
omara007 said:funzero said:It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
.
Sorry to say you are WRONG ..
DFT doesn't verify the function .. it verifies that manufactoring has be done correctly or not ..
sparso said:omara007 said:funzero said:It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
.
Sorry to say you are WRONG ..
DFT doesn't verify the function .. it verifies that manufactoring has be done correctly or not ..
How about loop-back tests with built in analyzers? Thats part of DfT but testing the actual functionality.