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DFT is concerned about inserting some non-related to the design functionality circuits for the purpose of being able to easily test the chip after being manufactored and locate the mal parts in order to define the yield of the patch.
It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
When your chip was in silicon format , it can only response to your stimulate .
So you will do your best to achieve this two points.
all your internal node can be set and obeserved,in this point your chip can be full tested .
so DFT means you must think test before your chip 's manufactured .
It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
When your chip was in silicon format , it can only response to your stimulate .
So you will do your best to achieve this two points.
all your internal node can be set and obeserved,in this point your chip can be full tested .
so DFT means you must think test before your chip 's manufactured .
It stand for Design For Test.
It means you must provide a method to verify your silicon chip's function .
When your chip was in silicon format , it can only response to your stimulate .
So you will do your best to achieve this two points.
all your internal node can be set and obeserved,in this point your chip can be full tested .
so DFT means you must think test before your chip 's manufactured .
Scan chain assertion and atpg is only a part of DFT not all.
You must think how to do your test , and then you can test your circuit.
Testing scheme is planned in the beginning of asic or project.
This is just a technique to test your chip is manufactured correctly / not. This involves putting in test structures and verifying the same through patterns.
This is just a technique to test your chip is manufactured correctly / not. This involves putting in test structures and verifying the same through patterns.
DFT aims to :
- be able to figure out whether my manufactured chip has any physical defects.
- test the manufactured chip by adding some test structure (during the design phase) which will aid the desired amount of testability finally.
Scan, BIST etc.... and just some of the examples of test structures that we commonly add in the chip. Yes... as someone already mentioned these test structures do not have any significance in the functionality of the chip. These are purely meant for TESTABILITY.
DFT refers to those design techniques that makes test generation and test application cost effective to increase the test coverage,to reduce time to market to achieve high quality metrics.
DFT as earlier defined by many members on the forum stands for Design for Testability or Design for Test
Its different from the functional verification which run to check the desiign functions according to the fucntionality
but It is closely related to functional verification problem of determining if the circuit specified by the netlist meets the functional specifications, assuming it is built correctly.
Actually in DFT we use ATPG's to generate a testvector (which is a chain of '0's and '1's ) and then scanned through the scain chain with in design and verifiied against the expexted one
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