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Information about Design For Test for ASICs

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efundas

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I need the complete details with respect to the Desi*gn F*or T*es*t for AS*ICs.
I would be grateful if anyone could provide me the complete details of this or a link where I can get the complete details.
I had tried the go*og*l search but I could not make out what was relevent and what is not relevant.
Thanks in advance
 

cuiyujie

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Design for Test is big problem, there is no single complete solution for everything. If you simply want to test your own simple logic and use scan method, you can check this article: Ten Commandments of Scan Design, If you want to use BIST for memory test, it is usually provided by the vendor. If you want to do SOC test, you have to check P1500 standard and design your own test methodology, which is very complex.
 

andromeda

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"Bible" about DFT topic is famous book:
Abromovici, Miron, ... "Digital Systems Testing and Testable Design" (1990)
but it is maybe to teoretical for engenner who don't wont to specialise in this field

Very nice book (and enought for everybody who don't wont to became DFT specialist) is:
"Design-For-Test for Digital IC's and Embedded Core Systems" from Alfred L. Crouch
 

mihotron

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anyone have this book in pdf or someting like
 

satya_422

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if u have this book please upload it
thanks&regards,
vikram.





andromeda said:
"Bible" about DFT topic is famous book:
Abromovici, Miron, ... "Digital Systems Testing and Testable Design" (1990)
but it is maybe to teoretical for engenner who don't wont to specialise in this field

Very nice book (and enought for everybody who don't wont to became DFT specialist) is:
"Design-For-Test for Digital IC's and Embedded Core Systems" from Alfred L. Crouch
 

shiv_emf

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Desi*gn F*or T*es*t

Desi*gn F*or T*es*t for AS*ICs.
y r u writing this with "*" in between ...any spl meaning ??
 

FLEXcertifydll

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Desi*gn F*or T*es*t

I think DFT include mang stage, based on Ur design's target. ATPG, TFT, LED, BIST
 

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