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SC3K01 said:Hi there,
Does anyone have experience in creating test structure to measure metastability and delay of flip flop in silicon?
Best Regards
Pulzar said:You could create a setup where one a clock signal is flopped using any other async clock. This will cause a good number of metastability cases. Then, flop the output of that flop into two flops -- one with the same clock as the metastable flop, and one with a variable delay attached to the same clock.
Put a comparator between the two flops, and count the number of times they are not the same. Put the variable delay to a high enough number to have no miscompares, and then start lowering it until you do see them appearing. That'll give you a good idea of the longest time your flop is staying metastable.
jamesyang1209 said:We have used metastability behavior to generate "random number generator" in ASIC.