That’s why they make high speed active oscilloscope probes.You might do functional testing at varying supply and
temperature, looking for environmental margin. But
you will not gain any info about what failed or why,
only the application envelope of the assembly.
High speed DDR has signal integrity sensitivities and
attaching a 10pF 'scope probe to later generations
stands a chance of messing up the eye and causing
the failure you're looking for. "A scope" may not be
the equipment you're looking for (or to avoid).