rivendu
Junior Member level 3
hi
i am investigating offsets of clocked (latched) comparators. my method is to put a ramp signal at the comparator input from 0 to VDD with a slope of VDD/t_ramp.
t_ramp is the rise time at the input from a pulse source. the comparator is driven with a sampling frequency of 10MHz.
the transistion of a latched comparator is at a time when the clock signal gets high. Thus the comparator is triggered by a rising edge.
is it the right way to measure the offset, which is a typical static characteristic, when i look at the voltage value at the time when the transition occurs and subtract the reference voltage from the measured?
Assuming a reference voltage of 0.5V , the transition is at the rising edge of the clock signal at, let us say, 0.505V. Then the offset voltage is 5mV with a tolerance of deltaV. The deltaV is defined as the voltage difference between the start and the end of a clock period. For t_ramp of 200µs and VDD of 1V we have a slope of m=1V/200µs (of course). A sampling frequency of 10 MHz has a period of 100ns. The deltaV is then 0.1µs * 1000mV/200µs=500µV. The tolerance can be lowered with a slower ramp. The resolution for that offset of 5mV for a comparator with a rail-to-rail ICMR would be ln(1V/5mV)~7 bits. For an ICMR of 0.35 to 1V, this would be ln(0.65V/5mV)~7 bits as well.
do you think the method is right?
i am investigating offsets of clocked (latched) comparators. my method is to put a ramp signal at the comparator input from 0 to VDD with a slope of VDD/t_ramp.
t_ramp is the rise time at the input from a pulse source. the comparator is driven with a sampling frequency of 10MHz.
the transistion of a latched comparator is at a time when the clock signal gets high. Thus the comparator is triggered by a rising edge.
is it the right way to measure the offset, which is a typical static characteristic, when i look at the voltage value at the time when the transition occurs and subtract the reference voltage from the measured?
Assuming a reference voltage of 0.5V , the transition is at the rising edge of the clock signal at, let us say, 0.505V. Then the offset voltage is 5mV with a tolerance of deltaV. The deltaV is defined as the voltage difference between the start and the end of a clock period. For t_ramp of 200µs and VDD of 1V we have a slope of m=1V/200µs (of course). A sampling frequency of 10 MHz has a period of 100ns. The deltaV is then 0.1µs * 1000mV/200µs=500µV. The tolerance can be lowered with a slower ramp. The resolution for that offset of 5mV for a comparator with a rail-to-rail ICMR would be ln(1V/5mV)~7 bits. For an ICMR of 0.35 to 1V, this would be ln(0.65V/5mV)~7 bits as well.
do you think the method is right?