hi..
i am trying to find the coverage of a external pattern..
i want to know if it is possble to estimate the coverage of a ckt in TetraMax which does not have scan chain..pls tell me the step by step procedure..if there isn't, is there any other tool i can use?my ckt has 42 flops..
Yes you can run a fault grading simulation using Tetramax and a functional wgl pattern. Although Synopsys doesn't recommend this, as this isn't what tmax was designed for, but it is possible.
i know that fault grading is possible for external patterns..my question is, is it possible for a ckt which does not have scan chain?
i have tried doing it, but no patterns were generated..the .wgl file had only "pattern 0" and "end"..
is there some method to generate patterns for non scan-chain designs?
ok..
i have the netlist and the protocol file of my design without the scan chain..i also have the patterns..if i use these files in tetramax to find the coverage in the full sequential mode, will it work?
i am trying to find the fault coverage of a already exsisting pattern..
Added after 6 minutes:
i want to find the fault coverage of the alredy exsisting patterns(which donot include scan input) on a ckt that does not have scan chain..but from what a know, it is not possible to find the fault coverage in tetramax without a scan-chain..so, is it possible for me to use the the patterns i have and map them to the "_pi" input and not use the scan input/output(test_si/test_so) at all?
will the coverage i get from such a simulation be correct?
You don't need to do this mapping. Like I stated my first post Tetramax has the functionality of being a fault grading simulator.
There is a whole chapter in the tmax user guide, titled "Fault Simulation" that explains the flow.