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most probably it will be greater than 1 million.....
Flash endurance is specified under the worst case conditions, i.e maximum voltage and temperature, if you can ensure that both the voltage and temperature is low then flash endurance is very much higher and may meet your one million requirement.
Along with having to buy the parts from a single lot, then testing some of the parts (to death) then having to return the bulk of the parts if they fail your test and buy new ones...rinse and repeat until you have the parts you need.If you picked a gentler programming cycle and were willing to
accept a worse low-retention-time bit-population-tail you
might well get to a million write cycles. But are you willing
to do your own reliability work? Probably not.
Quote Originally Posted by pjmelect View Post
Flash endurance is specified under the worst case conditions, i.e maximum voltage and temperature, if you can ensure that both the voltage and temperature is low then flash endurance is very much higher and may meet your one million requirement.
Have any data to back up this claim? I could believe perhaps 10-15% increase in the cycle count but a 10x improvement, I really doubt that.