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Doubt abt future
Hello friends,
I wanted to know what are the pros & cons of starting career in ASIC back end from service based company. Please tell me advantages and disadvantages.
Thanks
-Mahantesh
Re: Timing closure doubt
Hi,
I have one interview common question in timing closure. The question goes as follows.
Suppose there are 10 setup and 10 hold violations in a design. Manager will come and tell you that design needs to be taped out tomorrow. As much as possible violations need to...
Thanks Albred,
Metal 2 & 3 will be perpendicular to each other. Suppose in metal 2 & metal 4 there can be crosstalk right?
I also wanted to know the whether crosstalk is more between same metal layers or in different metal layers with spacing is same for different cases.
Hi,
I have one interview common question in timing closure. The question goes as follows.
Suppose there are 10 setup and 10 hold violations in a design. Manager will come and tell you that design needs to be taped out tomorrow. As much as possible violations need to be fixed. How you go about...
crosstalk between metal layers
Hi,
Crosstalk between two nets, is it possible to happen between two different metal layers of signal routing i.e metal 2 & metal 3?
Thanks in advance
Mahanthesh
Hello k_vlsi,
I think multiple vdd is possible between two FF's. This can happen when two FF's are placed in two different subchips and path exists between those FF's. In this explanation i am assuming that subchips uses different vdd.
Thanks & Regards
Mahanthesh
Hi shantha,
Have u taken care that sum of the delays of the two inverter should be 1/4 the time period of the clk ur applying at the input of combi circuit.
The combi ckt as it looks should work.
I wanted to know what is the output ur getting?
Regards
Mahanthesh
Hello eagle,
Usually different voltage domains are used for different subchips in the design. A
path running from one subchip to other subchip will be their. So there can be multi-
vdd combinational logic circuits in the timing paths running from one subchip to other subchip.
Regars
Mahanthesh
U can look into this book
**broken link removed**
by vishwani agrawal
or
Digital Systems Testing and Testable Design Miron Abramovici, Melvin A. Breuer,
Arthur D. Friedman
http://as.wiley.com/WileyCDA/WileyTitle/productCd-0780310624.html
I think this is sufficient......
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