What is low background Iddq in device?

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It's explained in the top paragraph of the same page:


"For devices,which do not exhibit low background Iddq..." means "devices not belonging to the very deep submicron regime", i.e. devices generated by process sizes >≈ 100nm .
 

IDDQ refers to a "quality" test method for digital parts
where supply current is monitored per functional vector
looking for state dependent out-of-family current. It is
a way to cull "functional, but a certain class of not-right"
from the population - say, a gate with a gate ox defect
that "works" but might drift worse (and you have no way
of knowing - only knowing something is not right, so kill
it.

Obviously this works best when nobody leaks or they
all leak the same.
 

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