stenzer
Advanced Member level 3
Hi,
when reading TVS datasheets there are different (dependent) values listed i.e. clamping voltage V_CL, pulse peak current I_pp and and dynamic resistance R_D. Those values are stated for different conditons, usually for a 10/1000 µs and a 8/20 µs double exponential test pulse.
- I'm curious how this values are determined excactly, by means of test setup. E.g. is a voltage source with a defined output/series resistor connected to the TVS and its pulse peak voltage is varied?
- Is the maximum clamping voltage statistical evaluated? How is the maximum value "chosen"?
- Why is the maximum clamping voltage for a shorter test pulse (8/20 µs) higher than those of a longer one (10/1000 µs)? The dynamical resistance is lower for a short test pulse, so what "limits" the current through the TVS which is responsible for the high clamping voltage?
I'm thankful for any explanation and references to detailed literature.
BR
when reading TVS datasheets there are different (dependent) values listed i.e. clamping voltage V_CL, pulse peak current I_pp and and dynamic resistance R_D. Those values are stated for different conditons, usually for a 10/1000 µs and a 8/20 µs double exponential test pulse.
- I'm curious how this values are determined excactly, by means of test setup. E.g. is a voltage source with a defined output/series resistor connected to the TVS and its pulse peak voltage is varied?
- Is the maximum clamping voltage statistical evaluated? How is the maximum value "chosen"?
- Why is the maximum clamping voltage for a shorter test pulse (8/20 µs) higher than those of a longer one (10/1000 µs)? The dynamical resistance is lower for a short test pulse, so what "limits" the current through the TVS which is responsible for the high clamping voltage?
I'm thankful for any explanation and references to detailed literature.
BR