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synopsis ATPG help!!!!!QQ

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jazz

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Any one can help me!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!i appreciate very much!!!!!!!!!!!
============================================
when I run the DC to gen the test pattern in my design, tools shows the fault coverage is zero..........following is my cmd and message...

1. ) create_test_patterns -output test.vdb \
-backtrack_effort high \
-compaction_effort high \
-max_random_patterns 100 Combinational Test Pattern Generation starts:

Non-collapsed Collapsed
No. of detected faults 0 0
No. of abandoned faults 0 0
No. of tied faults 0 0
No. of redundant faults 0 0
No. of untested faults 26952 17318
Total no. of faults 26952 17318
Fault coverage 0.00 0.00

No. of test patterns 0

Test Generation Time (CPU) 0.20 sec
Information: No tests generated - conflicting signal requirements in design. Use the 'report_test -atpg_conflicts' command for more information. (TEST-208)

2. ) when I use the 'report_test -atpg_conflicts' , it show that there are 6 inout port in my design....but these birdirational port are necessary and I wish these ports to output my test data.....

3. ) In DC, it may "not" gen the test pattern if the design has the bidirectional port in it, really?
If it can gen the test pattern, how could i do to set the command? and the the test data can be sent out form these bidirection port?
and the fault coverage is not "ZERO!"



jazz
 

gnomix

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Hi Jazz,
It is very hard to analyze the problem with this information,
please try the following commands
and verify if you have "test design rule violation" into your design

set_test_methodology full_scan
set_scan_style multiplexed_flip_flop
check_test -verbose
B.G.
Gnomix
 

jazz

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Hi, gnomix , tks for your reply, ......

ya, there are some design rule viloation" in my design, but the scan _chanin is insert successful for the syncronous clock, and when I replace the bidirection port cell to the output cell, the tools can gen the test_pattern successfuly, .........so, i doult that, it is the bidirectional cell problem, which cause the atpg tool can not gen the test pattern.........


jazz
 

jazz

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and the reference manual of DC says that, the bidirectional cell or tristate may cause the low fault coverage or may be fail to gen the test patterns........


jazz
 

jazz

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and I have the atpg cobflicts show that........


report_test -atpg_conflicts
Warning: Design 'test' has '4' unresolved references. For more detailed information, use the "link" command. (UID-341)

****************************************
Report : test
-atpg_conflicts
Design : test
Version: 2000.05-1
Date : Wed May 7 17:57:54 2003
****************************************

Design Object Conflict Reason
------------- ---------------
MP06 (Net) three-state contention/float

1


jazz
 

gnomix

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Jazz,
try to force (with the Test_Enable pad) the bidirectional in output mode and set true the variable atpg_bidirect_output_only (normally false)

atpg_bidirect_output_only = "true"

I don't know if this way can solve your problem , normally I following a most complex flow.

Gnomix
 

jazz

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HI, gnomix:
Tks very much for your suggestion, I will try it!
Appreciate very much1 ^^


BTW, what the complex flow you folow for the test_compiler?

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jazz

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Hi, gnomix!!!!!!!!!!!11
Tks very very very very very.....................MUCH to you!

It can works now!


tks you!!!!!!!!!!!!!!!!!!!!!!!!!!1^^
but what flow do you follow to do the test_compiler????


jazz
 

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