spice model of carbon nano wire/tube: reliability issue

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iamlearning

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Hello,
Can anyone please comment on the reliability of the spice models of carbon nano wire/tube? Spice simulators calculate the current through the mos devices using the drift-diffusion equations. So, I think, the spice models of carbon nano wire/tube are based on the approximation of their i-v curves to the equivalent drift-diffusion equations, whereas, actually currents through the CNW/CNT are (Quasi) Ballistic. Though, the I-V curves obtained from the spice simulations match well with the measured data, but I wander- can we rely on these models without any question? Or, is there no chance that, ultimately we have to build up the ballistic model of CNW/CNT?
I shall be glad, if someone shares his idea about it ...
Regards,
 

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