Scan based test generation in synopsys tetramax

[manjarip]

Hi,

I am trying to generate scan based test patterns for sequential circuit (iscas s27 for example) for testing only the compinational part for stuck-at faults. I have followed the required steps (providing the scan inserted circuit, .spf files), however the collapsed fault list shows the faults in test_se,test_so, test_si , CK and the clocks and scan enable etc for each flip flops etc in addition to the faults in the combinational logic. Please help!

 

[maulin sheth]

Can you please let us know what is your exact question?

 

[manjarip]

Can you please let us know what is your exact question?

Hello,

Thank you for your reply. My query is
How to run the tetramax ATPG to test a sequential circuit using a scan chain ?

 

[maulin sheth]

Are you interested for TetraMAX ATPG flow?
If yes, then just go through the user guide/tool manual. There after let us know whatever you have a doubts.
Tool manual contain all the mandatory steps/ required files/ how to perform. So request you to just go through it.

 

[manjarip]

Yes. Thank you for your reply. I am going through the tutorial.