[Question] Device reliability issue

[OMEsystem]

I have one question, Can 1V devices, 0.13um cmos, sustain 3V swing in
transient in system start-up time? Does it cause reliability problem?

 

[heverlee]

I guess it is best to read some oxide breakdown paper for the answer

 

[JVNPAVANKUMAR]

I dont think it will work,the general rule of thumb

may be considered as 20% of nominal supply +nominal supply leads to device break down

 

[betty1007]

heverlee is right

 

[rajanarender_suram]

i think 1-V device cannot sustain 3V swing. i accept that 1V device might have higher oxide breakdown than applying a field of 3V. but it might be restricted to 1V because lot of other effects such as Hot electron effect so on.

 

[mdcui]

in our design we usually allowsome suspitious power glitch to be 20% more than the device spec for limited time, for example 20ns, I think from system design, the high swing should be overcomed through certain circuit techniques instead of exposing it to the low voltage devices.