Nov 5, 2006 #1 S STOIKOV Full Member level 4 Joined Nov 18, 2005 Messages 236 Helped 8 Reputation 16 Reaction score 2 Trophy points 1,298 Activity points 3,083 which are the advantages to measure on-wafer ? can a chip be characterized with and without matching when doing this kind of measurement, in order to get measurements at different conditions ?
which are the advantages to measure on-wafer ? can a chip be characterized with and without matching when doing this kind of measurement, in order to get measurements at different conditions ?