Welcome to EDAboard.com

Welcome to our site! EDAboard.com is an international Electronics Discussion Forum focused on EDA software, circuits, schematics, books, theory, papers, asic, pld, 8051, DSP, Network, RF, Analog Design, PCB, Service Manuals... and a whole lot more! To participate you need to register. Registration is free. Click here to register now.

on-wafer characterization

Status
Not open for further replies.

STOIKOV

Full Member level 4
Joined
Nov 18, 2005
Messages
236
Helped
8
Reputation
16
Reaction score
2
Trophy points
1,298
Activity points
3,083
which are the advantages to measure on-wafer ?
can a chip be characterized with and without matching when doing this kind of measurement, in order to get measurements at different conditions ?
 

Status
Not open for further replies.

Similar threads

Part and Inventory Search

Welcome to EDABoard.com

Sponsor

Top