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How to do Monte Carlo analysis when the DC analysis sweeps a model parameter?

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dsk635

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Hi,

I have to find the variation in the output of my design when the vth0 parameter of the mos devices varies. I inserted the required DEV and LOT values in the models and tried doing a MC analysis. The problem I encounter is that each run is a DC analysis of the circuit where one of the model parameter is varied. Orcad pspice does not do the MC analysis in this case saying that one cannot do a MC analysis when the DC analysis sweeps a model parameter.

Is there a way to get around this limitation? Or any other version of spice which will do this?

Thanks,
-DSK
 

sunjiao3

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Re: Monte Carlo help...

Well, as for this question, wish you search for another monte carlo post on this board. Humungus gave very clear explanation on it. I wrote down some of them.

LOT parameters have the same value everytime they are instanced.
DEV parameters have the different values in every instantition.
LOT parameters represent the variation of whole lot processed.
DEV parameters corresponds to mismatch amongy similar devices.


If he see this question, he may give you much more clear answer.
Good luck.
 

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