doooo
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When I measure near field using a near field probe from antenna, PCB, ICs etc. (simply H-probe).
I can see some peaks through Spectrum Analyzer(SA) according to clock frequency (in case of digital ICs).
By the way, if the measured field is reactive field it may not be harmful as a EMI source because the field will be bounded near the component. In contrast, if the field is radiative field it must be a EMI source.
Normally, if peaks which level is higher than a certain level are shown on the screen of SA, we determine the component can not be passed becuase of EMI regulation.
So, my question is how can I recognize measured fields whether reactive or radiative field from a near field measurement results?
Thanks.
I can see some peaks through Spectrum Analyzer(SA) according to clock frequency (in case of digital ICs).
By the way, if the measured field is reactive field it may not be harmful as a EMI source because the field will be bounded near the component. In contrast, if the field is radiative field it must be a EMI source.
Normally, if peaks which level is higher than a certain level are shown on the screen of SA, we determine the component can not be passed becuase of EMI regulation.
So, my question is how can I recognize measured fields whether reactive or radiative field from a near field measurement results?
Thanks.