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In vlsi fault refers to a signal b stuck at logic 0 or logic 1.
There exist different technique to determine the fault that exist in combinational or sequential circuits.
In complex circuits we don't know which lines(nets) are faulty ,so there exist different fault detection method to find these faulty nets(Deductive ,parallel, concurrent, ATPG..etc).
I understood testing is used to determine fault in chip
fault may be occur during fabrication , during connection , during packaging
Q1 If fault is present in component , which testing method we will use to detect fault ?
Q2If fault is present in interconnection , which testing method we will use to detect fault ?
Q3 If fault is know, can we recover fault in chip ?
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