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My query regarding the different mode we have in STA & DFT ..
Functional
Transition fault test capture
PBIST
Extest Capture
Intest Capture
Scan Shift
Scan Shift Inversion
ATPG Mode
Stuck At Mode
Can someone explain in detail. What are all these modes & what is the frequency of operation with example ..
Extest Capture, Intest Capture are not the mode.. but they are related to JTAG...
Basically we have Scan Design, BIST and JTAG.....but all three are covered in the DFT modes...
Can I know what is the source of this information?
Extest & Instest capture are the modes in STA. May be you have n't seen such scenario. Apart from this we have PBIST & TFT_Capture too.
But was looking for detailed information about these .. If somebody can share then it will be helpful ..
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