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Burn-in tests on Analog and mixed signal design

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ranger01

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In Digital domain Burn-in tests are performed by applying the stimulus which can result in maximum toggling of the design nets under extreme Temperature and Voltage conditions. How is it performed on Analog and Mixed signal blocks?
 

erikl

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As the customer specifies (and pays) it.
 

ranger01

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erikl, this seems to be a redundant question, but is it recommended to re-use TAP I/F for Burn-in on Mixed signal blocks? How is it done usually? Do we carry out Burn-in tests for all the blocks in the chip together?
 
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erikl

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... is it recommended to re-use TAP I/F for Burn-in on Mixed signal blocks?
Sure you can do this, but wouldn't it be better to run the burn-in in real application? You don't need to verify the fault coverage again and again!

How is it done usually? Do we carry out Burn-in tests for all the blocks in the chip together?
This seems to be a redundant answer ;-): it's done as the customer specifies it - and usually he'd like to run the burn-in like his application.
 
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