You'll have to refine our question. Stuckat and transition faults are 2 different types of faults and test coverave apply to both. You always need the 2 metrics (Test Coverage for SA and TC for Transition faults). TF patterns detect slow-to-rise and slow-to-fall faults while SA pattern detect stuck and open faults.
@speed fault testting require 1 launch and 1 captur cyclee to be tested.
For @stuckat, 1 capture cycle is often sufficient to detect a fault (unless there are nonscan elements to initialize, or using ram sequential patterns..).
You can fault grade TF patterns into the SA universe, performing fault simulation, then topup with SA patterns.