+ Post New Thread
Results 1 to 4 of 4
  1. #1
    Junior Member level 3
    Points: 1,337, Level: 8

    Join Date
    Jul 2012
    Posts
    25
    Helped
    0 / 0
    Points
    1,337
    Level
    8

    ATPG Test Coverage for stuck@ and @speed

    Hi all,
    Why the test coverage is more for "stuck-at" as compared to "at-speed or transition pattern" in ATPG? and which type of fault is not covered in transition that will cover in stuck-at?

    •   AltAdvertisement

        
       

  2. #2
    Advanced Member level 5
    Points: 8,136, Level: 21

    Join Date
    Apr 2016
    Posts
    1,712
    Helped
    301 / 301
    Points
    8,136
    Level
    21

    Re: ATPG Test Coverage for stuck@ and @speed

    because stuck at is a convenient fault model, relatively easy to cover. it is purely functional, no speed dependency.
    Really, I am not Sam.



    •   AltAdvertisement

        
       

  3. #3
    Junior Member level 3
    Points: 1,337, Level: 8

    Join Date
    Jul 2012
    Posts
    25
    Helped
    0 / 0
    Points
    1,337
    Level
    8

    Re: ATPG Test Coverage for stuck@ and @speed

    Quote Originally Posted by ThisIsNotSam View Post
    because stuck at is a convenient fault model, relatively easy to cover. it is purely functional, no speed dependency.
    Yeah surely, in stuck at as per it's name no speed dependency but in terms of fault covering which type of faults it will cover so coverage is more than transition.



    •   AltAdvertisement

        
       

  4. #4
    Newbie level 2
    Points: 2,084, Level: 10
    Achievements:
    7 years registered

    Join Date
    Jan 2008
    Posts
    2
    Helped
    0 / 0
    Points
    2,084
    Level
    10

    Re: ATPG Test Coverage for stuck@ and @speed

    You'll have to refine our question. Stuckat and transition faults are 2 different types of faults and test coverave apply to both. You always need the 2 metrics (Test Coverage for SA and TC for Transition faults). TF patterns detect slow-to-rise and slow-to-fall faults while SA pattern detect stuck and open faults.
    @speed fault testting require 1 launch and 1 captur cyclee to be tested.
    For @stuckat, 1 capture cycle is often sufficient to detect a fault (unless there are nonscan elements to initialize, or using ram sequential patterns..).
    You can fault grade TF patterns into the SA universe, performing fault simulation, then topup with SA patterns.



--[[ ]]--