[Memory Fault Models]Difference between Stuck-at Fault and Transition Fault

Hi guys, I don't know whether this post is in right place. I'm studying Memory BIST. I'd like to know what's difference between Stuck-at Fault model and Tranistion fault model. It seems that they are the same.
Thanks!

a) stuck at faults are of two types:
1. stuck at zero(SA0): A line is permanently stuck to logic 0 irrespective of any value changes on that line.
2. stuck at one(SA1): A line is permanently stuck to logic 1 irrespective of any value changes on that line.

b) Transition Faults : these are those in which gate delay may be larger then the expected value(slow to rise or slow to fall types) due to which any signal changes may skip i.e. these are the errors which occur during transition

you can find more detail in this book
"ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS by M.L.Bushnell"

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a) stuck at faults are of two types:
1. stuck at zero(SA0): A line is permanently stuck to logic 0 irrespective of any value changes on that line.
2. stuck at one(SA1): A line is permanently stuck to logic 1 irrespective of any value changes on that line.

b) Transition Faults : these are those in which gate delay may be larger then the expected value(slow to rise or slow to fall types) due to which any signal changes may skip i.e. these are the errors which occur during transition

you can find more detail in this book
"ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS by M.L.Bushnell"

But I think they are the same. When a cell contains 0, with both SAF and TF, we cannot write 1 to this cell

Transition Faults are concentrate on the delay for the gate,while SA only concentrate on VDD or ground.Because through SA, you cannot detect if there is any delay faults.

Delay testing is done at AT-SPEED testing, not at scan clock.

Thanks, so the difference lies in the physical causes of two fault models.

Re: [Memory Fault Models]Difference between Stuck-at Fault and Destructive Read

Hi All,
I am working in the similar area. I am testing SRAM for various faults using March Algorithms using VHDL code. I am not able as to how to sensitize, detect read distructive/read disturb faults. Also pls let me know the Difference between Stuck-at Fault and Read Destructive fault. During simulation how could I differentiate these two faults. Because, both of them read 0 when they are supposed to read 1. unlike transition faults there is no time difference. Algorithm says if I read twice Destructive faults can be identified . But how to understand this.Pls Help.

Thanks.