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Now I need to use LFSR to generate pseudo-random test vectors and input them into the benchmark scan chain of the full scan structure to obtain fault coverage. I have tried manually writing the generated test vectors into the STIL file, but in the Force PI step of full scan simulation, primary...
Assuming that after I configure the sequential circuit with DFT, I need to write a STIL file to input my test patterns to simulate the fault coverage,but the STIL file need procedure of "capture_clk" or "load_unload" and so on, making file writing and simulation processes more complex.At the...
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