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Recent content by pennsia

  1. P

    Problem with converting the WGL due to the MUXClock mode

    Re: Tmax at-speed STIL It even could not get DRC pass.
  2. P

    Problem with converting the WGL due to the MUXClock mode

    Hi, Our testing engineer told me he can not convert the WGL due to the MUXClock mode in my at-speed ATPG patterns. I checked UserGuide and it seems by creating "_fast_WFT_" waveform format and then using it in capture_CLK procedure can fix it. But I always get syntax errors, such as...
  3. P

    what is test assertion failure?

    It's reported as an assertion failure during the bench test when loading firmware. It's real failure or something else?
  4. P

    what is test assertion failure?

    Hello, Could anyone tell me what is test assertion failure? How does it happen in bench test? Thanks a lot!
  5. P

    how to specify internal net as scanmode signal

    I used DFTAdvisor. The command is like: 1. add primary input /.../../scan_mode which pulls out your internal signal and treats it as primary input 2. setup scan insertion -ten /.../../scan_mode -active high which defines that signal to be your scan_mode I believe DFT Compiler has the similar...
  6. P

    ATPG ATE test - failure occurs after 35 patterns

    Re: help on ATPG ATE test! Thanks a lot to all! 1. I have only one clk domain, cause all the internal generated clks have been muxed by scan_mode signal; 2. I did stuck-at fault ATPG; 3. Before delivered the patterns, I have ran all the parallel patterns and three serial patterns. All passed...
  7. P

    ATPG ATE test - failure occurs after 35 patterns

    Re: help on ATPG ATE test! Nobody can help? I'm not a testing engineer...
  8. P

    ATPG ATE test - failure occurs after 35 patterns

    help on ATPG ATE test! Hi, everyone, I generated ATPG patterns using Mentor's Fastscan and simulated with sdf back-annotation. But the test engineer could not get the patterns passed on ATE. And the first fail happens to the 36th pattern (serial) which means the first 35 patterns are fine...
  9. P

    pure input/output/bi-direction pins in the leakage test

    leakage test How to deal with pure input/output/bi-direction pins in the leakage test? The reason to keep in reset is to avoid dynamic power consumption? Any hint will be highly appreciated!
  10. P

    why FIFO design using grey code?

    gray code fifo I see. So the only reason to use grey code is to save the times of flipping. But we do need grey2bin and bin2grey both in real FIFO design, right?
  11. P

    why FIFO design using grey code?

    fifo design Can anyone explain the reason for grey code used in FIFO deisng? Thx a lot.
  12. P

    The simplest way to design a pulse generator

    Re: pulse generator Thanks saeed_pk for your reply. Could you give me a schematic? cause I'm still confusing...
  13. P

    The simplest way to design a pulse generator

    Re: pulse generator It is an interview question. Assume the width of input pulse (let's say only one pulse) is between 4Tclk and 5Tclk (Tclk is the input clk cycle time) and it could start from any point (may align with the clk edge or not). But the output pulse width needs to be exact twice of...
  14. P

    The simplest way to design a pulse generator

    pulse generator spanish Could anyone tell me the simplest way to design a pulse generator which will double the width of the input pulse by clocking it? The input pulse width has nothing to do with the clock pulse. Thanks a lot.
  15. P

    why DFTAdvisor inserts back slash?

    Thanks, anssprasad, What confusing me is that there is no wire or net share the same name in the raw netlist. And for a bus, like pad_dat with 10 bits, only some of them have been renamed, some remain untouched. So far I did not find any command to constrain renaming. Any other suggestion?

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