What do you mean by "blind"?
RF noise, or pulsations in power draw, could bother
the regulation loop or the measurement of it.
When you say it "destroys the measurement" it
makes me think you are only looking at results and
should be looking for causes with non-ATE
instruments. Like a high bandwidth 'scope that
is referred to measurement ground, looking at
ADE7953 ground, power, output, feedback and
other controls - including IC pins that may have
been left to float - while performing the tests
on the platform that is giving you trouble.
What does "destroys" mean, anyway - just an
unacceptable (per some arbitrary limit) repeatability,
a gross malfunction (like repeatably 3V out instead
of 1.8), ???