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User defined test point for memories while Scan Insertion

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jjean

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Hi,
I was doing scan insertion for a design which has a few memories.Since I saw that the inputs and outputs of the memories could not be fault detected, I added user defined test points for the i/o of the memories.But I see that the coverage has not increase and Tetramax still shows these points as not testable.What could be the reason for this behaviour?

Appreciate any help.
Thanks

PS:UDTP :eek:bserve points for inputs and control points for outputs
 

Re: User defined test point Insertion

Hi,


I was doing test point insertion for a design. How to find where to insert the test points. Please help me if any one knows or any related material.

Thanks
 

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