sudeeps
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Hello,
Please help me with the following questions :
If EM fails at the metal to diffusion contact, let's say source/drain contact and we cannot play with the w/l or no of contacts , is there a way to fix EM there ?
In ESD protection scheme , we put diodes at inputs to clamp the voltage. Considering that, why can't antenna diode save from ESD ( it's also a similar scheme where we put diode on gate )?
How do we check if half-DRC rule at the IP boundary is met ?
What decides if shielding is to be done with VSS or VDD ?
What decides the flip chip AP-RDL routing width ?
Thanks in advance.
Please help me with the following questions :
If EM fails at the metal to diffusion contact, let's say source/drain contact and we cannot play with the w/l or no of contacts , is there a way to fix EM there ?
In ESD protection scheme , we put diodes at inputs to clamp the voltage. Considering that, why can't antenna diode save from ESD ( it's also a similar scheme where we put diode on gate )?
How do we check if half-DRC rule at the IP boundary is met ?
What decides if shielding is to be done with VSS or VDD ?
What decides the flip chip AP-RDL routing width ?
Thanks in advance.