Obviously, device data won't allow to calculate the compensation. I guess, you realized, that the datasheet rather focusses on trigger current, according to common SCR applications. You would need to perform a compensation based mainly on empirical measurements I think.
I assume however, that for sensitive gate devices the systematic silicone diode T.C. of -1.9 mV/K will make the major part of temperature dependency. By the way, what's your application? A crow bar overvoltage protection circuit?