Continue to Site

Welcome to EDAboard.com

Welcome to our site! EDAboard.com is an international Electronics Discussion Forum focused on EDA software, circuits, schematics, books, theory, papers, asic, pld, 8051, DSP, Network, RF, Analog Design, PCB, Service Manuals... and a whole lot more! To participate you need to register. Registration is free. Click here to register now.

Obvious Question on ATPG and relaxed tests.

Status
Not open for further replies.

Grecs

Newbie level 6
Newbie level 6
Joined
Jan 7, 2013
Messages
14
Helped
0
Reputation
0
Reaction score
0
Trophy points
1,281
Visit site
Activity points
1,383
Hi From me,

I am about to present the latest papers about ATPG (automatic test pattern generation) and although i have understood every smallest detail i havent understood the most basic stuff. Well most of them are about producing relaxed tests. Whats the point of that? The only assumption i can make is that if we have a lot of i dont care bits maybe we can test more unrelated test vectors simultaneously but i dont know if i am correct. No paper makes that clear and all i can find on the internet is more papers that dont clear the matter.

Thank you
 

Status
Not open for further replies.

Similar threads

Part and Inventory Search

Welcome to EDABoard.com

Sponsor

Back
Top