LTSpice simulation question

[flabbergastt]

Hi,

I have a question about LTSpice, i'm still unfamiliar with what it can and cannot do.

Can LTSpice show errors for when something is exceeded? For example, a MOSFET drain to source voltage is being exceeded way too high? Or this must be known to the user beforehand?

thanks!

 

[esp1]

hi,
I have used LTS for a long time and its never raised an error message for the reasons you have stated.
Its upto you to read the datasheet for any device you are simulating and to be aware of its limitations.

Have you had any error messages you dont understand.?
E

 

[flabbergastt]

hi,
I have used LTS for a long time and its never raised an error message for the reasons you have stated.
Its upto you to read the datasheet for any device you are simulating and to be aware of its limitations.

Have you had any error messages you dont understand.?
E

Hey esp1,

No error messages, but you answered my question. Thanks a lot!

 

[juicedry]

When doing circuit simulations using SPICE, the modelling will not simulate breakdown voltages in traditional MOSFETs or BJTs.

See this old **broken link removed**

Zetex SPICE Models: Understanding Model Parameters and Applications Limitations by Neil Chadderton

I quote from it:

Breakdown voltage. The SPICE bipolar transistor models do not possess a breakdown voltage for any combination of terminals. This feature can be added within a subcircuit as above, by including a diode across the relevant terminals, with BV set to the minimum breakdown voltage specified on the transistor’s datasheet. However, this will only indicate that there is current flow under overvoltage or transient conditions - it will not of course model the effects this would have on a device. This includes effects such as hFE degradation due to reverse emitter-base current, heating and secondary breakdown effects, catastrophic breakdown of the gate oxide of MOSFETs, oscillation, and noise generation (at low values of avalanche current).

 

[Audioguru]

LTspice also will not show when a device will be destroyed by too much current or too much heat.