How can we use INTEST,EXTEST and BYPASS modes without wrapper in DFT for design having IP to improve test coverage for ATPG.
Is it affects any other things?
I don't understand what you are trying to achieve? You want to do both INTEST and EXTEST? Or you just want to improve test coverage?
A test wrapper is necessary to provide both test access and test isolation. You can't do INTEST and EXTEST without a test wrapper chain placed along the boundary of the core logic.
Unless your design already has an existing boundary IO registers by the ports, then you can share these functional registers with the wrapper cell logic. Though I doubt this is what you are really looking for?
The core wrapping flow that I mentioned above doesn't have a BYPASS mode. Tough I know there are similar flows like IEEE 1500 flow and boundary scan flow that provide a BYPASS mode. Again, DFT compiler can help you with those.
A test wrapper is necessary to provide both test access and test isolation. You can't do INTEST and EXTEST without a test wrapper chain placed along the boundary of the core logic.
Unless your design already has an existing boundary IO registers by the ports, then you can share these functional registers with the wrapper cell logic. Though I doubt this is what you are really looking for
IEEE 1500 flow and BSD flow likewise, either you provide your own boundary scan cells or DFT compiler provides one for you. The wrapper cells are circuits that provide your functional circuit with core testing features. You won't be able to test your chip on core/board level without them.
hi,
I understand the concepts of core wrapping.
I think we can also use INTEST and BYPASS modes with IP integration concepts.
Can anybody have any idea regarding it?