If you get the stuck-at(SA) 1 and SA-0 faults, than you need to find the location of the fault in the design. For finding the location, there are other algorithms available for diagnosis purpose and also tool can help to find location through diagnosis.
Are you talking of SA-1/ SA-0 for on chip(on tester) or in simulation?
If you get the stuck-at(SA) 1 and SA-0 faults, than you need to find the location of the fault in the design. For finding the location, there are other algorithms available for diagnosis purpose and also tool can help to find location through diagnosis.
Are you talking of SA-1/ SA-0 for on chip(on tester) or in simulation?
So first we need to check that chain test is passing or not?
if chain test is passing and we got the SA-1/SA-0 pattern failure thn we need to do diagnosis.
We can do the diagnosis using the tool itself.
TMAX supports the run_diagnosis command which is used to find the location of SA-1 and SA-0 fault.
There are different algorithms are available for diagnosis.