OK, design capacitors can be of different types.
For example, MOM (interdigitated) or MIM capacitors - they are affected by the BEOL, that is not correlated with the FEOL (transistors).
On the other hand, such capacitors as MOS caps, varactors, etc., may be correlated with the MOSFETs.
Similarly, with resistors - some of them ma be correlated with the FEOL (diffusion, poly), some of them are not correlated (e.g. thin film resistors).
In general, usually correlations are not well modeled bye the PDK - e.g. uncorrelated (in real life) metals and dielectrics are still treated as fully corre;ated by the BEOL corners (typical, RC worst, RC best, ...).
Industry tried statistical treatment of various variations (e.g. statistical STA), but gave up, due to complexity.