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Complex permittivity and complex permeability measurements

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grendhell

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I want to measure the complex permittivity and permeability of several materials using transmission/reflection and short-circuit methods using a VNA, waveguide or coaxial transmission lines.
I have found few papers and technical notes about them, but all of them are a very quick and not clear description of the methods without giving a proper step-by-step description of the procedure/algorithm.
My problems are:
- Can u please give me a step-by-step description of the procedure, including calibration of the equipment?
- I'm really puzzled by the "reference planes", how are they handled during and after the calibration?
- Can u please give me a step-by-step description of the S11 and S21 post-processing to obtain permittivity and permeability?
- Is there any available (preferably free) software which can post-process S11 and S21 to get material properties?
Any other comment/suggestion would be more than welcome

regards
 

Element7k

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Re: Complex permittivity and complex permeability measuremen

I rememeber a good step by step procedure with examples given in HP Product note 8510-3. There must be some updated versions lying about.

Rgdz,
E7k
 

grendhell

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Re: Complex permittivity and complex permeability measuremen

Thanks E7k for your tip, but I can't find this product note on the web. Do you have a copy of it?

cheers
 

Element7k

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Re: Complex permittivity and complex permeability measuremen

I think HP museum may have it but for now I hope the attached will help.

Rgdz,
E7k
 

    grendhell

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grendhell

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Re: Complex permittivity and complex permeability measuremen

Thank you very much E7k, let's see if I can implement it.

regards

grendhell
 

nccu1990

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Re: Complex permittivity and complex permeability measuremen

I think that this application note is useful.

RAC-0607-0019: Measurement of Dielectric Material Properties

Abstract
This application note describes the techniques to measure the dielectric properties of materials using a vector network analyzer. It also shows methods for converting the s-parameters to dielectric properties.

http://www2.rohde-schwarz.com/en/products/test_and_measurement/product_categories/network_analysis/ZVB-|-Application_Notes-|-20-|-904-|-1989.html
 

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  • rac-0607-0019_7911.pdf
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    grendhell

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