Bad:
More aggressive equipment and recipes on newer
technologies. Smaller gate oxide areas exposed
to same or larger metal peripheries.
Good:
New technologies have so much gate tunneling
current under normal conditions, that they may
laugh off the gate current from antenna charging.
Not so great:
Many new technologies are so crappy at the
device level that designers have to accommodate
aging effects, of which antenna damage can be
one (may manifest as a pre-charged gate and
spacer oxides, to relax later, appearing as a drift).