dig_des
Junior Member level 1
I couldn't find a thread on Ac scan.
I welcome the interested members to discuss emerging Ac scan techniques
in the latest process technologies (65nm, 45nm, 55nm etc).
Proposed topics for discusion:-
1. Different tools that are matured to handle Ac scan (transition & path delay)
patterns.
2. Architectures to generate at-speed clock.
3. Power grid issues while running ac scan patterns on tester.
4. Different basis to select ac scan patterns to increase test quality.
5. Any techniques to improve coverage.
Feel free to add more topics.
I welcome the interested members to discuss emerging Ac scan techniques
in the latest process technologies (65nm, 45nm, 55nm etc).
Proposed topics for discusion:-
1. Different tools that are matured to handle Ac scan (transition & path delay)
patterns.
2. Architectures to generate at-speed clock.
3. Power grid issues while running ac scan patterns on tester.
4. Different basis to select ac scan patterns to increase test quality.
5. Any techniques to improve coverage.
Feel free to add more topics.