hello everyone..
we are designing a LNA using Infineon bfp740 and simulated it on AWR Microwave Office. in Infineon website, they gives AWR model of the transistor, but we can not have nonlinear analysis, for example; how can we measure OIP3. it gives the error message "the interception point measurement must specify order two or more"..
could anyone please help us with our problem.
thank you
hello everyone..
we are designing a LNA using Infineon bfp740 and simulated it on AWR Microwave Office. in Infineon website, they gives AWR model of the transistor, but we can not have nonlinear analysis, for example; how can we measure OIP3. it gives the error message "the interception point measurement must specify order two or more"..
could anyone please help us with our problem.
thank you