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//Verilog Code for 4X1 Priority Mux
module pr_mux4 (a,b,c,d,sel,out);
input a,b,c,d;
input [1:0] sel;
output out;
reg out;
always@(a or b or c or d or sel)
begin
if (sel == 2'b00)
out = a;
else if(sel == 2'b01)
out = b;
else if (sel == 2'b10)
out = c;
else
out = d...
Can you please refer the below link and explain if possible
**broken link removed**
As per the pdf(link) , jitter impacts both setup and hold time on two different conditions
You can use an ATPG (Automatic Test Pattern generation) tool to generate the input sequence (test patterns).
Eg : Tetramax (Synopsys), Fastscan (Mentor Graphics)
@Tushar : Note its "stuck-at" fault not "struck-at"
Instruction Memory and Data Memory act as Cache for providing fast access. Normally Cache are made up of SRAM. So most likely, Instruction Memory and Data Memory are SRAM
Inorder to decrease the ATPG untestable faults, try running Fast Sequential or Full Sequential ATPG Engines (Using run_atpg -fast_sequential_only or run_atpg -full_sequential_only commands). But Full or Fast sequential algorithms need more runtime as they are computationally intensive algorithms...
Refer Low Power fill (Synopsys tetramax)......Tetramax can generate patterns in a manner , where there is less switching between consecutive bits in a pattern.
TetraMAX fill the "unused" bits of a shift in sequence with 1s or 0s, depending on the values on the USED bits. That is, some bits of a...
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