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Recent content by vijayatmu

  1. V

    Taping out with WNS..

    hello all, Is it common in first maskset to tapeout with some WNS on some of the paths? WIll you still signoff STA as ok and go ahead with tapeout. I understand this depends on the design and how conservative various design constraints are setup, etc etc. But if the timing constraints and...
  2. V

    FIFO architecture and flipflops

    RCA, Thank you for the code for the dual access flop. Is there change of data contention happen when both read and write control signal happen at the same time. This is given that read is async and write is synchronous with the clock. Unless the control unit of the fifo handles it in such a way...
  3. V

    FIFO architecture and flipflops

    Hello RCA, What is a dual access flop. Is it a read and write at the same time? Can you please share any material that you may have on the design of a dual access flop. Vijay
  4. V

    post layout simulation

    Agree with rca reply. It is also likely, the specify timing check is not conditioned properly. I have seen many such false failures in my project.
  5. V

    vera simulation does not start

    Re: using VCS thank you it worked. I think I missed a file when I ran the first time.
  6. V

    vera simulation does not start

    using VCS Hello all, I am new to VCS. I have a crc_tx and crc_rx which calls sub blocks crc5 and crc 16. I also have a test bench written for crc_tx and crc_rx. When I run the vcs command like below, I get error message saying unresolved modules. How do I need to run the vcs command so it...
  7. V

    what is a CKBD pattern test of flash memory?

    It is way of testing out the memory cell by stoing a 10-10 pattern in the memory array, so as to induce maximum stress on the cell. With this kind of pattern a defective cell will have a charge loss or charge gain and the data on the cell might get altered which are caught during subsequent testing.

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