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Q.2: A seguential full SCAN circuit with two primary inputs, one primary output, and five flip-flops (chained as FF1, FF2, FF3, FF4 and FF5) is being tested for transition delay faults. The following LOC test set has been generated using an efficient combinational ATPG with 100% fault...
Q.1: Assume that the normal function of a register (made up of D FFs) in a large circuit is both to load data in parallel as well as shift. A multiplexer is used to select the input appropriate to each FF. Show how in a SCAN design it may be possible to use the SCAN operation for both functional...
Q.3: Imagine yourself as a test engineer at a leading semiconductor company. Your manager wants to reduce the SCAN test time for an integrated circuit, which has a single long scan chain, by a factor of 10. However, the designers are reluctant to add additional scan pins by implementing ten scan...
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