mona_patel
Newbie level 6
How can we use INTEST,EXTEST and BYPASS modes without wrapper in DFT for design having IP to improve test coverage for ATPG.
Is it affects any other things?
Is it affects any other things?
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Code dot - [expand] 1 2 3 4 5 6 7 8 9 # specify your INTEST/EXTEST Encoding define_test_mode INT_TEST -usage wrp_if -encoding {test_mode0 1 test_mode1 0} define_test_mode EXT_TEST -usage wrp_of -encoding {test_mode0 1 test_mode1 1} # Add wrapper core set_dft_configuration -scan enable -wrapper enable set_wrapper_configuration -class core_wrapper -style dedicated set_scan_configuration -chain_count 2 -test_mode INT_TEST set_scan_configuration -chain_count 1 -test_mode EXT_TEST
I dont know how can we implement this modes in scan so that we can generate patterns individually for all of them.
Code dot - [expand] 1 2 3 4 current_test_mode INT_TEST write_test_protocol -out <your-file> current_test_mode EXT_TEST write_test_protocol -out <your-file>
And what about BYPASS mode?
Code Bash - [expand] 1 2 # IEEE 1500 example: set_dft_configuration -ieee_1500 enable
Code Bash - [expand] 1 2 # Boundary scan example: set_dft_configuration -bsd enable
Can we not use INTEST,EXTEST and BYPASS mode without using wrapper insertion?
A test wrapper is necessary to provide both test access and test isolation. You can't do INTEST and EXTEST without a test wrapper chain placed along the boundary of the core logic.
Unless your design already has an existing boundary IO registers by the ports, then you can share these functional registers with the wrapper cell logic. Though I doubt this is what you are really looking for