badola
Member level 5
Hi all,
In my design i have pll, cpu and embedded memories as black box. I am generating the stuckat reconfigure patterns using fastscan. I am loosing some 4.13% covergae because of black boxes only. This coverage loss is because of AU faults. I checked one AU fault, it is showing that the fault before the black box in not observed at the output. I have some 24k scan cells in my design. After pattern generation i am getting 17k AU faults. Now the issue is if i try to add observe point at each Au fault then my area is increasing almost twice. Can anyone suggest me how should i create a bypass model for faults for bypassing the black boxes. I am usinf DFT compiler for scan insertion and Design Compiler for synthesis. I am using set_test_point_element command for adding the observe point. Please suggest where should and how should i make the bypass logic.
Looking forward for help from u guys.
Thanks in advance.
sudhanshu
In my design i have pll, cpu and embedded memories as black box. I am generating the stuckat reconfigure patterns using fastscan. I am loosing some 4.13% covergae because of black boxes only. This coverage loss is because of AU faults. I checked one AU fault, it is showing that the fault before the black box in not observed at the output. I have some 24k scan cells in my design. After pattern generation i am getting 17k AU faults. Now the issue is if i try to add observe point at each Au fault then my area is increasing almost twice. Can anyone suggest me how should i create a bypass model for faults for bypassing the black boxes. I am usinf DFT compiler for scan insertion and Design Compiler for synthesis. I am using set_test_point_element command for adding the observe point. Please suggest where should and how should i make the bypass logic.
Looking forward for help from u guys.
Thanks in advance.
sudhanshu
