Wheatley
Junior Member level 2
Hi,
I am working with Cadence in an AMS 0.35 µm technology. I have a simple PMOS transistor layed out in a n-well over the general p-substrate. I am trying to measure the leakage current occurring because of the nwell-psub junction. For this purpose, I have tied to and the Source, Drain and Gate terminals and I am DC-sweeping the Body voltage from 0 V to 3.3 V. As I see it, I should see how the body current flowing from the Body terminal to the general substrate increases until reaching the reverse saturation current (around 0.3 fA, according to my calculations).
However, what I see is a huge leakage current increasing indefinitely at a constant rate of 2 fA/mV.
I attach a sketch for illustrating all of this.
Why is this happening?
Thanks in advanced!
I am working with Cadence in an AMS 0.35 µm technology. I have a simple PMOS transistor layed out in a n-well over the general p-substrate. I am trying to measure the leakage current occurring because of the nwell-psub junction. For this purpose, I have tied to and the Source, Drain and Gate terminals and I am DC-sweeping the Body voltage from 0 V to 3.3 V. As I see it, I should see how the body current flowing from the Body terminal to the general substrate increases until reaching the reverse saturation current (around 0.3 fA, according to my calculations).
However, what I see is a huge leakage current increasing indefinitely at a constant rate of 2 fA/mV.
I attach a sketch for illustrating all of this.
Why is this happening?
Thanks in advanced!