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compression logic (EDT)

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If you have any explanation, Could you please provide me?

scan chain length is proportional to the number of flops in your design. the number of test vectors is proportional to how complex the logic between flops is. compression can reduce the number of test vectors, but it will not alter the design. so the length remains the same.
 
Thanks for the information provided. Could you please let me know how the compression logic helps in reducing the testing time of a design.
 

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