stuck_adc
Member level 2
M. MAHONEY “DSP-Based Testing of Analog and mixed-signal circuits” IEEE Computer Society Press, 1990.
B. Ayari, N. Ben-Hamida and B. Kaminska, “Automatic Test Vector Generation for Mixed-Signal Circuits”, The European Conference on Design Automation, PARIS, Marsh 1995, pp. 458-463.
M. V. Bossche, Schoukens, and J. Rennboog “Dynamic testing and Diagnosis of A/D converters” IEEE Transactions on Circuits and Systems, August 1986, pp. 775-785.
A. Charoenrook and M. Soma “A Fault Diagnosis Technique for Flash ADC’s”, International Test Conference 1993, pp.
M. F. WAGDY “Diagnosing ADC onlinearity at the Bit Level” IEEE iransactions on instrumentation and Measurements, December 1989, pp.1139-1141.
J. BLAIR “Histogram Measurement of ADC Nonlinearities using Sine
Waves” IEEE Transactions on Instrumentation and Measurements, June
1994, pp.373-383.
M. F. WAGDY AND S. S. AWAD “Determining ADC Effective Number
of Bits Via Histogram Testing” IEEE Transactions on Instrumentation
and Measurements, August 1991, pp. 770-772.
B. Ayari, N. Ben-Hamida and B. Kaminska, “Automatic Test Vector Generation for Mixed-Signal Circuits”, The European Conference on Design Automation, PARIS, Marsh 1995, pp. 458-463.
M. V. Bossche, Schoukens, and J. Rennboog “Dynamic testing and Diagnosis of A/D converters” IEEE Transactions on Circuits and Systems, August 1986, pp. 775-785.
A. Charoenrook and M. Soma “A Fault Diagnosis Technique for Flash ADC’s”, International Test Conference 1993, pp.
M. F. WAGDY “Diagnosing ADC onlinearity at the Bit Level” IEEE iransactions on instrumentation and Measurements, December 1989, pp.1139-1141.
J. BLAIR “Histogram Measurement of ADC Nonlinearities using Sine
Waves” IEEE Transactions on Instrumentation and Measurements, June
1994, pp.373-383.
M. F. WAGDY AND S. S. AWAD “Determining ADC Effective Number
of Bits Via Histogram Testing” IEEE Transactions on Instrumentation
and Measurements, August 1991, pp. 770-772.
