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The PCM Data Acquisition System is required to handle both analog and digital data. These data, acquired from the variety of sensors and transducers employed, are processed by the PCM system and recorded in digital form by an onboard magnetic tape recorder during flight.
Once the PCM encoder is programmed, the configuration
can be downloaded to a program in the Acroamatics
decommutator to evaluate the format, set the key hardware parameters in the decommutator, build the frame makeup, and provide a table of the data measurements
for display formatting. The decommutator hardware configuration must be identified. For data to be displayed, engineering unit conversion is provided for each wwwmeasurand.
Once the decommutator is programmed, preset display formats can be matched to functions to be displayed for immediate real time processing.
Software drivers are provided for the popular Labview and Matlab display suites commonly used in data telemetry processing.
The process control monitor (PCM) refers to the suite of test structures usually placed in the scribeline (alternatively named kerf, street or test key) separating product die on the wafer.
These test structures include such for measuring electrical parameters of active devices (Vth, gate diode breakdown, Idsat, channnel length/width reduction, drain/source series resistance, etc), properties of passive devices (area capacitances, sheet resistance (diffusion, poly, metal), contact/via resistance, etc.) and in- line relevant parameters such as linewidth control, alignment, etc.
PCM data is process control monitoring data. Also another name is WAT data stands for wafer acceptance test data.
Some test structures usually ring oscillator, transistors with different sizes are placed in scribe line at at least 5 places inside the wafer. It used to measure the characteristics for the process so that the process engineers know this wafer lot can be accepted or not. Most of the time, it measures Vth, capacitance, resistance, IDS, leakage current.. etc
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