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Re: regarding design for testability
digital test kenambo
mainly scan design iam feeling tough which include muxed d scan cell,lssd,clocked scan,dft architectures like full ,partial and random scan
Re: regarding design for testability
iam new to course.subject name is design for testability
now the topic going is fault simualtion,scan test,scoap etc
[Moved]regarding cadence basics doubts
hello guys
please some one help me its urgent
how to find region of operation of mos in cadence?
how to find value of current or voltage at a particular point in circuit in cadence?
how to give b eff value in cadence?
thanks in advance
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